Tantalum Nitride Acoustic Emissions
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Several Acoustic Emissions were collected in a laboratory setting,
using a diamond-tipped probe to impact
a film of tantalum nitride deposited on sapphire.
How the data sets were obtained is described in Provenance.
All data sets were collected with an S9220 Physical Acoustics sensor,
with 60dB amplification,
and at a sampling rate of 20MHz.
If you want to download any or all data sets,
see Download Information.
Table of available data.
Sensor |
Location |
Ampl (dB) |
Fs (MHz) |
MATLAB |
ASCII |
S9220 |
upper surface |
60 |
20 |
ae1 |
ae1a |
S9220 |
upper surface |
60 |
20 |
ae3 |
ae3a |
Specimen
Ta2N was deposited onto (112bar0) sapphire
using a DC magnetron sputtering system using a tantalum target with argon
and controlled amounts of nitrogen as a carrier gas.
Equipment
This data was collected during a nanoindentation process,
performed by
a continuous micromechanical testing device developed at IBM.
Sensor Mounting
The S9220 sensor was mounted directly above the specimen.
(The diamond-tipped probe approached from below).
Amplifier
60 dB amplification.
Oscilloscope Settings
Data was collected on a Tektronix oscilloscope.
Data Handling
Thanks
To
Professor Gerberich
of
CEMS
for permission to use his data.
And to David Bahr, also of CEMS, who collected the data
and patiently explained material science concepts to EE personnel.
The data sets described in the above table
are available for download from our
ftp data archive.
Click on any given filename,
and your web browser should download
the corresponding (compressed) data set
to your computer.
All of the data sets have been compressed using Info-Zip's zip utility.
For a description of data formats,
including links to free Info-Zip utilities,
see Formats.
Experience suggests that Info-Zip compresses
our MATLAB files by a factor of about 20:1,
and ASCII files about 40:1.
Keep this in mind when downloading data.