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1. Lynn Watt |
Magnetics g-Fe2O3 Particles |
Ph.D.EE |
55 |
AHM |
Univ. Wash |
|
2. Se Puan Yu |
Single g-Fe2O3 Particle: MvsH |
Ph.D.EE |
55 |
AHM |
Fairchild Semi |
|
3. Don Bonstrom |
Fe3O4 K-Band Resonance |
Ph.D.EE |
59 |
AHM |
Control Data |
|
4. Clark Johnson |
M-H General Ellipsoid Curves |
M.S.EE |
61 |
WFB |
3M |
|
5. Dionysios Speliotis |
Cryomagnetics Iron Oxides |
Ph.D.EE |
61 |
AHM |
IBM |
|
6. Erich Valstyn |
g-Fe2O3 K-Band Resonance |
Ph.D.EE |
62 |
AHM |
IBM |
|
7. John Holm |
YIG Permeability vs. Frequency. |
M.S.EE |
63 |
AHM |
3M |
|
8. Juri Matisoo |
Model Magnetic Film Switching |
Ph.D.EE |
64 |
RPH |
IBM |
|
9. John Hanton |
GdIG Xtal: Coercivity vs Temp |
Ph.D.EE |
64 |
AHM |
Montana St. |
|
10. Jack Judy |
YIG(Si) Xtal:X-Band Resonance |
Ph.D. EE |
65 |
AHM |
IBM |
|
11. Paul Besser |
a-Fe2O3 Xtal: Magnetics |
Ph.D.EE |
65 |
AHM |
Rockwell |
|
12. Clark Searle |
a-Fe2O3 Xtal: X-Band Res. |
Ph.D.EE |
65 |
AHM |
U. Manitoba |
|
13. Anton LaBonte |
2D Bloch Wall Simulation |
Ph.D.EE |
66 |
WFB |
Control Data |
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14. Bob Sundahl |
AuFe Short-Range Order |
Ph.D.MET |
66 |
JMS |
Bell Labs |
|
15. Tu Chen |
CuPd Short-Range Order |
Ph.D.MET |
67 |
JMS |
IBM |
|
16. Charlie Stapper |
Ferromagnetic Spheres |
Ph.D.EE |
67 |
WFB |
IBM |
|
17. Dick Fayling |
Faraday Effect/Fine Particles |
M.S.EE |
68 |
WFB |
3M |
|
18. David Palermo |
Magnetic CoV Thin Films |
M.S.EE |
68 |
DES |
Control Data |
|
19. Tom Johanson |
CoV and CoW Films: Hc vs T |
M.S.EE |
68 |
DES |
SperryUnivac |
|
20. Dale Berndt |
CoV and CoW Thin Films: Hc |
M.S.EE |
69 |
DES |
Nortronics |
|
21. Dick Welch |
Obliquely Evaporated Films |
M.S.EE |
69 |
DES |
Nortronics |
|
22. Anne Joshi |
Short Range Order Alloys |
M.S.MET |
69 |
JMS |
Mich. Tech |
|
23. Ed Wuori |
Magnetite Thin Films |
M.S.EE |
70 |
DES |
3M |
|
24. Nathan Curland |
Iterative Model Mag Recording |
Ph.D.EE |
71 |
DES |
Microbit |
|
25. Tatsuo Fujiwara |
Kerr Magneto-Optical SNR |
M.S.EE |
72 |
JHJ |
Toshiba |
|
26. Steve Bendson |
CoSm and CoGd Thin Films |
Ph.D.EE |
72 |
JHJ |
3M |
|
27. Daryl Dressler |
Lorentz TEM Recorded Bits |
Ph.D.EE |
73 |
JHJ |
3M |
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28. Wendell Snyder |
Magnetite Ferrofluid |
Ph.D.EE |
74 |
WFB |
Bureau Mines |
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29. Greg Cosimini |
Electron Mirror Microscope |
M.S.EE |
76 |
JHJ |
SperryUnivac |
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30. Jim Grabau |
Demagnetization Eigenmodes |
M.S.EE |
77 |
JHJ |
Control Data |
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31. Chuck Brower |
Ion Beam Sputt Permalloy Films |
M.S.EE |
78 |
JHJ |
Colo St. U. |
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32. Hardayal Gill |
Perp. Anis. Amorph.GdFe Films |
Ph.D.EE |
78 |
JHJ |
Nat. Semi. |
|
33. Tom Coughlin |
Sputtered CoCr Thin Films |
M.S.EE |
80 |
JHJ |
Nortronics |
|
34. Ed Wuori |
Mag. Reversal CoCr Films |
Ph.D.EE |
84 |
JHJ |
Megabyte |
|
35. Ga Lane Chen |
Sputtered Al Oxide Films |
Ph.D.EE |
85 |
JMS |
Varian |
|
36. Jong Kai Lin |
Sputtered Fe Oxide Films |
Ph.D.MS |
86 |
JMS |
Honeywell |
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37. Chongwon Byun |
CoCr Films: Transition Layer |
Ph.D.MS |
86 |
JMS |
Digital |
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38. Scott Mazar |
Rigid Disk Spinner Tester |
M.S.EE |
87 |
JHJ |
Honeywell |
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39. Ron Indeck |
Microloop Perp. Head Field |
Ph.D.EE |
87 |
JHJ |
Wash Univ |
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40. Chengyea Leu |
RF Sputtered Carbon Films |
Ph.D.MS |
87 |
MS |
Seagate Mag |
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41. Sang Lee |
Medium-Scale MIG Heads |
M.S.EE |
88 |
JHJ |
Seagate Mag |
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42. Durga Ravipati |
Sputt.CoCr Films Rigid Disk |
Ph.D.MS |
88 |
JMS |
Digital |
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43. Graham Cameron |
Bitter, M/O, LTEM, SEMPA |
M.S.EE |
88 |
JHJ |
U of M |
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44. Earl Benser |
FEM: Thin Film Inductors |
M.S.EE |
88 |
JHJ |
Honeywell |
|
45. Chuck Pentek |
Media Logic Floppy Disk Tester |
M.S.EE |
88 |
JHJ |
IBM |
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46. Mingjyue Huang |
FEM: Shielded MR Head |
M.S.EE |
88 |
JHJ |
U of M |
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47. Tom Ritzdorf |
Sputt.Soft NiZn Ferrite Films |
M.S.MS |
89 |
JMS |
Seagate |
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48. Steve Chapman |
Magneto-optical Imaging |
M.S.EE |
89 |
JHJ |
IBM |
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49. Matthew Dugas |
Large-Scale Perp. Recording |
M.S.EE |
89 |
JHJ |
AdvResCorp |
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50. Yung Yip |
MIG Heads: AlSiFe Films |
M.S.EE |
89 |
JHJ |
EPI |
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51. Mark Jesh |
BN Films: Friction/Wear |
M.S.MS |
89 |
JMS |
Seagate |
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52. Ciu-Ter Chang |
FEM: 2-D Stress Analysis |
Ph.D.MS |
90 |
JMS |
Infomag |
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53. Tom Rask |
FEM: MIG Head Saturation |
M.S.EE |
90 |
JHJ |
Seagate |
|
54. Tom Chang |
Kerr M/O Magnetometer |
M.S.EE |
90 |
JHJ |
U of M |
|
55. Mike Troemel |
Carbon Films: Friction/Wear |
M.S.MS |
90 |
JMS |
Seagate |
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56. Martin Vos |
Intrinsic Noise Thin Film Media |
Ph.D.EE |
90 |
JHJ |
3M |
|
57. Graham Cameron |
Lorentz TEM:Recorded Bits |
Ph.D.EE |
91 |
JHJ |
Honeywell |
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58. Chyu Torng |
Carbon Nitrogen Thin Films |
Ph.D.MS |
91 |
JMS |
Applied Mag |
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59. Miaogen Lu |
CoCr/Cr Films: Magnetics |
M.S.EE |
92 |
JHJ |
Komag |
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60. Tangeshiun Yeh |
CoCrTa/Cr:Micromagnetics |
Ph.D.MS |
92 |
JMS |
Honeywell |
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61. Yi-Min Hsu |
CoCrTa/Cr:Recording Noise |
Ph.D.MS |
92 |
JMS |
Komag |
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62. Mark Lagerquist |
MFM Recorded Bits & MRAM |
M.S.EE |
92 |
JHJ |
IBM |
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63. Gzim Ocakoglu |
Simulation Adaptive DFE |
M.S.EE |
92 |
JM |
Switzerland |
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64. Shahran Jamshidi |
Simulation Sequence Detection |
Ph.D.EE |
92 |
JM |
IBM |
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65. Tai Min |
CoCrTa/Cr: Multilayers/Noise |
M.S.EE |
93 |
JHJ |
U of M |
|
66. Sian She |
Optimum Filter for FDTS/DF |
M.S.EE |
93 |
JM |
Cirrus Logic |
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67. Tom Chang |
MFM Single BaFe Particles |
Ph.D.EE |
93 |
JGZ |
IBM |
|
68. Mingjyue Huang |
Calculation Hc Anisotropy |
Ph.D.EE |
93 |
JHJ |
Read-Rite |
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69. Taehyun Jeon |
Timing in Adaptive Systems |
M.S.EE |
93 |
JM |
U of M |
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70. Zhaohui Qu |
VSLI Implem. FDTS/DF |
M.S.EE |
93 |
JM |
|
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71. Tai Min |
Bicrystal Thin Film Media |
Ph.D.EE |
93 |
JGZ |
Rky Mtn Mag |
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72. Tse-An Yeh |
CN Overcoatings: Tribology |
Ph.D.MS |
93 |
JMS |
Conner |
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73. Yi-Min Guo |
Simulation 2D Bloch Wall |
M.S.EE |
94 |
JGZ |
U of M |
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74. Andy Jaeb |
In-Line Sputtering System |
M.S.EE |
94 |
JHJ |
Seagate |
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75. Qi-Xu Chen |
Thin Film Media/PFCB Disks |
M.S.EE |
94 |
JHJ |
Conner |
|
76. Miaogen Lu |
CoCrTa/Cr:Magnetics/Noise |
Ph.D.EE |
94 |
JHJ |
Komag |
|
77. Yi-Min Guo |
Micromagnetic Model MR Head |
Ph.D.EE |
94 |
JGZ |
Headway |
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78. Haiyun Wang |
Transition Noise Correlations |
M.S.EE |
94 |
JGZ |
Quantum |
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79. Hamid Shafiee |
Knowelege-Based Adaptive DSP |
Ph.D.EE |
94 |
JM |
TI |
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80. Weining Zeng |
Optimum Detection Channel |
Ph.D.EE |
94 |
JM |
Conner |
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81. Pawl Glijer |
CoCrPt and CoCrPtB/Cr Media |
Ph.D.MS |
95 |
JMS |
Toyota TI |
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82. Kysuik Sin |
CoCrTa and CoCrTaPt/Cr Media |
Ph.D.MS |
95 |
JMS |
Stanford |
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83. Chien-Li Lin |
Giant Magnetoresistance Films |
Ph.D.MS |
95 |
JMS |
Headway |
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84. Chad Rice |
Timing Recovery for PRML |
M.S.EE |
95 |
JM |
|
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85. Jin Li |
DC-Free Run-Lenth Ltd Codes |
M.S.EE |
95 |
JM |
Seagate |
|
86. Saptho Nair |
Robust Equalization & Detection |
Ph.D.EE |
95 |
JM |
IBM |
|
87. Xiao-Guang Ye |
Simulation Nano-Xtal Media |
Ph.D.EE |
95 |
JGZ |
Quantum |
|
88. Danzhu Lu |
Modeling of MR Heads |
M.S.EE |
95 |
JGZ |
Komag |
|
89. Yansheng Luo |
MFM Single Fe Particles |
M.S.EE |
95 |
JGZ |
U of M |
|
90. Eric Swensen |
Thermal Testing Power Supplies |
M.S.EE |
95 |
JHJ |
IBM |
|
91. Sally Doherty |
BaFe Particles Switching Calc |
M.S.EE |
95 |
JGZ |
CMU |
|
92. Taehyun Jeon |
Digital VCR |
M.S.EE |
95 |
JM |
U of M |
|
93. Juren Ding |
MFM Recording Edge Overwrite |
Ph.D.EE |
95 |
JGZ |
Seagate |
|
94. Yansheng Luo |
MFM High Density Recording |
Ph.D.EE |
95 |
JGZ |
IBM |
|
95. Wengzhong Zhu |
Patterned GMR Spin Valves |
M.S.EE |
95 |
JHJ |
Seagate |
|
96. Terrence Lam |
Recording Nonlinearities |
M.S.EE |
95 |
JGZ |
U of M |
|
97. Jason Gadbois |
Switching Nano-Scale Elements |
M.S.EE |
95 |
JGZ |
Honeywell |
|
98. Geng Wang |
Multilayer GMR Spin Valves |
Ph.D.MS |
96 |
JMS |
Samsung |
|
99. Xing Song |
Perpendicular Thin Film Media |
Ph.D.MS |
96 |
JMS |
Seagate |
|
100. Jay Loven |
Compare Long&Perp Recording |
M.S.EE |
96 |
JHJ |
Seagate |
|
101. Joy Wentworth |
Fast Adaptive Equalization |
M.S.EE |
96 |
JM |
U of M |
|
102. Taehyun Jeon |
Digital VCR |
Ph.D.EE |
97 |
JM |
U of M |
|
103. Zhaohui Li |
Nonlinear MR head impact to PRML |
M.S.EE |
97 |
JGZ |
Samsung |
|
104. Tae-Seok Yang |
Digital Tape Recording |
M.S.EE |
97 |
JM |
U of M |
|
105. Terrence Lam |
Partial erassure |
Ph.D.EE |
97 |
JGZ |
IBM |
|
106. Dehua Han |
GMR, thin film media & time decay |
Ph.D.EE |
97 |
JHJ, JGZ |
Seagate |
|
107. Jinghuan Chen |
Keepered media and thermal decay |
M.S.EE |
98 |
JHJ |
U of M |
|
108. Cheng Yang |
Thermal decay in thin film media. |
Ph.D.MS |
98 |
JMS |
Seagate |
|
109. Travis Oenning |
Near-Optimal Detection |
M.S.EE |
98 |
JM |
U of M |
|
110. Barrett Brickner |
Low-Complex RL Ltd Codes |
Ph.D.EE |
98 |
JM |
Seagate |
|
111. Young Kim |
High Density Tape Channels |
Ph.D.EE |
98 |
JM |
TI |
WFB=William Fuller Brown, Jr. AHM=Allen H. Morrish RPH=Richard P. HalversonDepartments:
JMS=John M. Sivertsen JHJ=Jack H. Judy DES=Dionysios E. Speliotis
JM=Jaekyun(Jay) Moon JGZ=Jian-Gang Zhu
EE=Electrical and Computer Engineering MET=Metallurgy MS=Materials Science
